Tuning the Topo-Morphological properties of ITO Films using Al-Ag interlayer for Low-Resistance Optoelectronics Devices

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Published: Jun 30, 2024
DOI: https://doi.org/10.62292/njp.v33i2.2024.238
Keywords:
Indium tin oxide, Topology, Morphology, Radio frequency, Magnetron sputtering

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Aliyu Kabiru Isiyaku
Mustapha Isah
Muhammad Munnir Aliyu
Aliyu Yakubu Tanko
Auwal Abdulkadir
Ahmad Hadi Ali

Abstract

Indium tin oxide (ITO) is recently attracting intense attention for application as transparent conducting electrode in different optoelectronic devices including solar cells, liquid crystal displays and organic light emitting diodes. This is attributed to their high optical transmittance in the visible region and good electrical conductivity. In this work, surface topological-morphological (topo-morphological) and electrical properties of ITO based multilayer films with aluminum-silver (Al-Ag) metal interlayer (ITO/Al-Ag/ITO) are investigated after post annealing treatment at 300-500oC by atomic force microscopic (AFM), field emission scanning electron microscopy (FESEM), four-point probe and hall-effect techniques respectively. The ITO/Al-Ag/ITO films are deposited by direct current and radio frequency magnetron sputtering techniques on p-type Si at room temperature. The results showed a smooth surface topology by as-deposited film with films smoothness improving after post annealing treatment as analyzed by AFM method. Sharp crystallites peaks were obtained by all the films with smaller peaks diffusing and recombining to form larger films with increasing post-annealing temperature. The films root means square roughness increased as the temperature increases with film annealed at 500oC showing a superior and enhanced microstructure. Compared to as-deposited film, careful observation shows that surface morphology smoothness increased with increase in temperature with films annealed at 400oC and 500oC showing highest increasing surface smoothness pattern as determined by FESEM technique. Similarly, higher grain sizes are observed especially by films annealed at 400oC and 500oC due to the heat absorption which causes the particles to expand thereby narrowing the grain boundaries and subsequently improve the surface smoothness. These FESEM findings are consistent with AFM measurements confirming the high surface property and enhanced grain size with increasing post annealing temperature. The films exhibit decreased electrical resistivity and sheet resistance while carrier concentration and Hall mobility increased with increasing post annealing treatment indicating highest corresponding values of...

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Isiyaku, A. K., Isah, M., Aliyu, M. M., Tanko, A. Y., Abdulkadir , A., & Ali, A. H. (2024). Tuning the Topo-Morphological properties of ITO Films using Al-Ag interlayer for Low-Resistance Optoelectronics Devices. Nigerian Journal of Physics, 33(2), 1–9. https://doi.org/10.62292/njp.v33i2.2024.238
Issue
Vol. 33 No. 2 (2024): Nigerian Journal of Physics - Vol. 33 No. 2
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Articles

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