SULEMAN, K. O.; ABDUL-AZEEZ, H.; EZIKE, F. I.; OYOR, D. I.; NWAUZOR, J. N.; KALU, J.; ALOR, K. P.; UGBAJA, C. M.; OKEREKE, B. O.; NWANEHO, F. U. Growth rate of AL2O3 Thin Film by Liquid Phase Deposition as an Anti-reflection Coating Layer on Crystalline Silicon for Solar Cell Applications. Nigerian Journal of Physics, [S. l.], v. 33, n. S, p. 75–83, 2024. DOI: 10.62292/njp.v33(s).2024.219. Disponível em: https://njp.nipngr.org/index.php/njp/article/view/219. Acesso em: 19 sep. 2024.